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Read Architectures for Multi-bit per cell NAND Flash Memories

Product Type: Market Research Report
Published by: Forward Insights
Published: September 2009
Product Code: R3643-8
Description
This report explores the theory, circuit elements, timings, and key design features of the conventional interleaved architecture versus the all bitline sensing architecture.
Table of Contents
Contents

CONTENTS

LIST OF FIGURES

EXECUTIVE SUMMARY

INTRODUCTION

NAND FLASH READ ARCHITECTURES

Conventional Read Architecture

Latch design

All Bitline Sensing (ABL) Architecture

Sensing Design

ABL Sensing vs. Conventional Read

Summary

REFERENCES

ABOUT THE AUTHOR

ABOUT FORWARD INSIGHTS

Services

Contact

REPORT OFFERINGS



List of Figures

Figure 1. NAND Architecture

Figure 3. Conventional Read: Essential Elements of the Page Buffer

Figure 4. Conventional Read Timing

Figure 5. Conventional Read Latches

Figure 6. Conventional Read: Latch characteristic for appropriate sizing

Figure 7. ABL sensing: Essential Elements of the Page Buffer

Figure 9. ABL sensing: the sense

Figure 10 Evaluation Time

Figure 11. Contributors to Parasitic Capacitance (Bitline cross-section)

Figure 12 Three adjacent bitlines and the effect of capacitive coupling between them

Figure 13 Yupin Effect

Figure 14. Cell working points

Figure 17 Programming Time for 2-bit/cell NAND Flash Memory

Figure 19 Energy Savings

Figure 20 3-bit/cell ABL Programming


List of Tables

Table 1. ABL vs. Conventional Read Architecture
Ordering and More Information
Price and Delivery Options



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